In-situ characterization of performance degrading defects in superconductor- dielectric microwave resonators


Describing a technique to measure in-situ electron paramagnetic resonance (EPR) losses of films, or specific superconducting resonators. Using this technique we are able to identify and quantify microwave losses from Mn2+ ions in Ba(Zn1/3Ta2/3)O3, Co2+ ions in Ba(Nb1/3Ta2/3)O3, and losses from dangling bond states in thin-film deposited amorphous Silicon.
amorphous Silicon summary slide